aiqbench analysis
This research introduces SWIFT, a machine learning framework that automates the characterization of excited-state structures in semiconductor quantum dot devices for spin-qubit applications. By combining ML-assisted feature identification with physics-informed processing, the system significantly reduces measurement errors and enables real-time optimization of large-scale quantum hardware. The approach effectively transforms complex two-dimensional spectroscopy analysis into a streamlined one-dimensional peak-detection problem, enhancing data quality even in low-signal environments.
Spectroscopy With Intelligent Feature Tracking for automated characterization of excited-state structure in semiconductor quantum dot devices
arXiv:2609.05686v1 Announce Type: cross Abstract: The characterization of excited-state structure in semiconductor quantum dot (QD) devices is an important component of tuning them for spin-qubit operation. We present Spectroscopy With Intelligent Feature Tracking (SWIFT), a framework that combines machine-learning (ML)-assisted feature identification with physics-informed geometric processing to extract energy-level splittings from pulsed-gate spectroscopy data. SWIFT isolates the relevant spectral features and exploits their characteristic geometry to reduce the two-dimensional spectroscopy analysis to a one-dimensional peak-detection problem. It further combines an ensemble-based confidence metric with sequential accumulation of rapid, low-SNR scans, allowing the inferred spectrum to be reevaluated as experimental evidence accumulates. Using Si/SiGe QD devices, we demonstrate SWIFT both offline and in real time, including automated tracking of QD excited states and lead resonances. Benchmarking on 255 manually labeled scans shows that SWIFT reduces the median splitting error to 0.05 mV from 0.11 mV for a classical baseline, with the largest improvement on lower-quality measurements. These results provide a path toward incorporating excited-state spectroscopy into autonomous QD characterization, tuning, and optimization, which will be essential in large-scale quantum dot devices.
Abstract:The characterization of excited-state structure in semiconductor quantum dot (QD) devices is an important component of tuning them for spin-qubit operation. We present Spectroscopy With Intelligent Feature Tracking (SWIFT), a framework that combines machine-learning (ML)-assisted feature identification with physics-informed geometric processing to extract energy-level splittings from pulsed-gate spectroscopy data. SWIFT isolates the relevant spectral features and exploits their characteristic geometry to reduce the two-dimensional spectroscopy analysis to a one-dimensional peak-detection problem. It further combines an ensemble-based confidence metric with sequential accumulation of rapid, low-SNR scans, allowing the inferred spectrum to be reevaluated as experimental evidence accumulates. Using Si/SiGe QD devices, we demonstrate SWIFT both offline and in real time, including automated tracking of QD excited states and lead resonances. Benchmarking on 255 manually labeled scans shows that SWIFT reduces the median splitting error to 0.05 mV from 0.11 mV for a classical baseline, with the largest improvement on lower-quality measurements. These results provide a path toward incorporating excited-state spectroscopy into autonomous QD characterization, tuning, and optimization, which will be essential in large-scale quantum dot devices.
Mesoscale and Nanoscale Physics (cond-mat.mes-hall); Applied Physics (physics.app-ph); Quantum Physics (quant-ph)
arXiv:2609.05686 [cond-mat.mes-hall]
(or arXiv:2609.05686v1 [cond-mat.mes-hall] for this version)
https://doi.org/10.48550/arXiv.2609.05686 Focus to learn more arXiv-issued DOI via DataCite (pending registration)
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