Reverse N-Wise Output-Oriented Testing for AI/ML and Quantum Computing Systems

Abstract:Artificial intelligence/machine learning (AI/ML) systems and emerging quantum computing software present unprecedented testing challenges characterized by high-dimensional/continuous input spaces, probabilistic/non-deterministic output distributions, behavioral correctness defined exclusively over observable prediction behaviors and measurement outcomes, and critical quality dimensions, trustworthiness, fairness, calibration, robustness, error syndrome patterns, that manifest through complex multi-way interactions among semantically meaningful output properties rather than deterministic input-output mappings. This paper introduces reverse n-wise output testing, a mathematically principled paradigm inversion that constructs covering arrays directly over domain-specific output equivalence classes, ML confidence calibration buckets, decision boundary regions, fairness partitions, embedding clusters, ranking stability bands, quantum measurement outcome distributions (0-dominant, 1-dominant, superposition collapse), error syndrome patterns (bit-flip, phase-flip, correlated errors), then solves the computationally challenging black-box inverse mapping problem via gradient-free metaheuristic optimization to synthesize input feature configurations or quantum circuit parameters capable of eliciting targeted behavioral signatures from opaque models. The framework delivers synergistic benefits across both domains: explicit customer-centric prediction/measurement coverage guarantees, substantial improvements in fault detection rates for ML calibration/boundary failures and quantum error syndromes, enhanced test suite efficiency, and structured MLOps/quantum validation pipelines with automated partition discovery from uncertainty analysis and coverage drift monitoring.

Machine Learning (cs.LG); Artificial Intelligence (cs.AI)

arXiv:2602.14275 [cs.LG]

(or arXiv:2602.14275v2 [cs.LG] for this version)

https://doi.org/10.48550/arXiv.2602.14275 Focus to learn more arXiv-issued DOI via DataCite

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