Pendell\"osung length-scale neutron and X-ray interferometry

arXiv:2609.24709v1 Announce Type: cross Abstract: Neutron and X-ray perfect-crystal interferometers (PCIs) are powerful platforms for studies of fundamental physics and phase-contrast imaging. Further enhancing several PCI capabilities requires reducing crystal blade thickness to the micron scale, which minimizes dynamical-diffraction image blur, permits operation in the pendell\"osung regime where blade thickness controls beam splitting, and reduces absorption for simultaneous neutron and X-ray operation. However, fabricating multiple crystal blades with identical micrometer-scale thicknesses over centimeter-scale areas remains a major challenge. Here, using a non-etching sub-micron fabrication technique, we demonstrate silicon triple-Laue interferometers with equal-blade-thicknesses of 110 $\mu$m and 350 $\mu$m, operated with both neutrons and X-rays. These devices are the thinnest PCIs realized to date, enabling a factor-of-six reduction in dynamical-diffraction beam spreading for improved phase-contrast imaging, while reaching the single pendell\"osung length regime in which crystal thickness provides an experimentally accessible control parameter for engineered quantum-optical beam splitting of plane-wave inputs. These results motivate multi-blade PCI designs utilizing identical half-pendell\"osung crystal lamellae that are proposed for neutron spin--orbit and electric dipole moment measurements.

Authors:Owen Lailey, Alexandre Boutot, David G. Cory, Joseph P. Cotter, Vishal Dhamgaye, Tao Hong, Michael G. Huber, Young-June Kim, Winfried Kockelmann, Jeremy W. Paster, Dusan Sarenac, Kawal Sawhney, Naume Shentevski, Ivar Taminiau, Dmitry A. Pushin

Abstract:Neutron and X-ray perfect-crystal interferometers (PCIs) are powerful platforms for studies of fundamental physics and phase-contrast imaging. Further enhancing several PCI capabilities requires reducing crystal blade thickness to the micron scale, which minimizes dynamical-diffraction image blur, permits operation in the pendellösung regime where blade thickness controls beam splitting, and reduces absorption for simultaneous neutron and X-ray operation. However, fabricating multiple crystal blades with identical micrometer-scale thicknesses over centimeter-scale areas remains a major challenge. Here, using a non-etching sub-micron fabrication technique, we demonstrate silicon triple-Laue interferometers with equal-blade-thicknesses of 110 $\mu$m and 350 $\mu$m, operated with both neutrons and X-rays. These devices are the thinnest PCIs realized to date, enabling a factor-of-six reduction in dynamical-diffraction beam spreading for improved phase-contrast imaging, while reaching the single pendellösung length regime in which crystal thickness provides an experimentally accessible control parameter for engineered quantum-optical beam splitting of plane-wave inputs. These results motivate multi-blade PCI designs utilizing identical half-pendellösung crystal lamellae that are proposed for neutron spin--orbit and electric dipole moment measurements.

Applied Physics (physics.app-ph); Optics (physics.optics); Quantum Physics (quant-ph)

arXiv:2609.24709 [physics.app-ph]

(or arXiv:2609.24709v1 [physics.app-ph] for this version)

https://doi.org/10.48550/arXiv.2609.24709 arXiv-issued DOI via DataCite (pending registration)

aiqbench analysis

Pendell\"osung length-scale neutron and X-ray interferometry

Related coverage