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This study investigates the time evolution of quantum entanglement between trapped electrons interacting via electromagnetic forces, utilizing covariance matrix formalism to quantify logarithmic negativity under varying thermal and squeezing conditions. The research specifically targets parameter regimes relevant for current and near-future single-electron trap experiments, bridging theoretical dynamics with practical experimental feasibility in quantum hardware.
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Entanglement dynamics through electromagnetic interactions in single-electron traps

arXiv2 min read

arXiv:2607.20236v1 Announce Type: new Abstract: We study the dynamics of quantum entanglement between two harmonically trapped electrons interacting via the electromagnetic force. Starting from two-mode Gaussian states at thermal equilibrium, we make use of the covariance matrix formalism in order to compute the logarithmic negativity of the evolved state as a quantitative measure of entanglement. We analyze two initial configurations: thermal single-mode and two-mode squeezed states, and describe the time evolution of entanglement in the system for different values of squeezing and temperature, while identifying the parameter regimes accessible to current and near-future single-electron trap experiments.

Abstract:We study the dynamics of quantum entanglement between two harmonically trapped electrons interacting via the electromagnetic force. Starting from two-mode Gaussian states at thermal equilibrium, we make use of the covariance matrix formalism in order to compute the logarithmic negativity of the evolved state as a quantitative measure of entanglement. We analyze two initial configurations: thermal single-mode and two-mode squeezed states, and describe the time evolution of entanglement in the system for different values of squeezing and temperature, while identifying the parameter regimes accessible to current and near-future single-electron trap experiments.

arXiv:2607.20236 [quant-ph]

(or arXiv:2607.20236v1 [quant-ph] for this version)

https://doi.org/10.48550/arXiv.2607.20236 Focus to learn more arXiv-issued DOI via DataCite (pending registration)

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Full text under the publisher's open licence · 182 words

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