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This study presents a significant advancement in quantum sensing by using dielectric interface engineering to stabilize near-surface nitrogen-vacancy centers under ultra-high vacuum conditions. By applying a TiO2 coating, researchers achieved a 79% increase in the NV- population and improved spin resonance contrast, effectively suppressing charge-state conversion dynamics at room temperature. This reproducible method offers a practical pathway for enhancing the reliability of nanoscale quantum sensors in extreme environments without compromising scanning-probe compatibility.
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Electrostatic Stabilization of Near-Surface Quantum Sensors via Dielectric Interface Engineering

arXiv2 min read

arXiv:2609.20137v1 Announce Type: new Abstract: Control of charge-state stability in near-surface quantum defects is critical for nanoscale sensing, yet remains particularly challenging under ultra-high vacuum (UHV), where surface-induced band bending destabilizes the metrologically relevant charge-state. Here, we present a robust and reproducible approach for stabilizing shallowly implanted (< 10 nm deep) nitrogen-vacancy (NV) centers in near-UHV conditions (P = $3 \times 10^{-9}$ mbar) based on dielectric interface engineering. Through measurements on individually addressable NV centers, we demonstrate that a TiO2 coating on the diamond suppresses surface-induced electrostatic fields, yielding a 79% increase n NV- population and a 45% enhancement in NV-spin resonance contrast at room temperature. Coherent control measurements further reveal suppressed charge-state conversion dynamics. These results establish dielectric screening as a powerful and reproducible strategy to engineer charge transition energetics of NV centers in scanning-probe-compatible geometries under extreme conditions.

Abstract:Control of charge-state stability in near-surface quantum defects is critical for nanoscale sensing, yet remains particularly challenging under ultra-high vacuum (UHV), where surface-induced band bending destabilizes the metrologically relevant charge-state. Here, we present a robust and reproducible approach for stabilizing shallowly implanted (< 10 nm deep) nitrogen-vacancy (NV) centers in near-UHV conditions (P = $3 \times 10^{-9}$ mbar) based on dielectric interface engineering. Through measurements on individually addressable NV centers, we demonstrate that a TiO2 coating on the diamond suppresses surface-induced electrostatic fields, yielding a 79% increase n NV- population and a 45% enhancement in NV-spin resonance contrast at room temperature. Coherent control measurements further reveal suppressed charge-state conversion dynamics. These results establish dielectric screening as a powerful and reproducible strategy to engineer charge transition energetics of NV centers in scanning-probe-compatible geometries under extreme conditions.

arXiv:2609.20137 [quant-ph]

(or arXiv:2609.20137v1 [quant-ph] for this version)

https://doi.org/10.48550/arXiv.2609.20137 Focus to learn more arXiv-issued DOI via DataCite (pending registration)

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Full text under the publisher's open licence · 226 words

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