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This symposium addresses critical metrology challenges in advanced chip fabrication, specifically focusing on thermal management for high-power AI processors and the evolution of atomic-scale measurement techniques. While AI is mentioned as a factor reshaping manufacturing, the core subject matter remains semiconductor physics, nanotechnology instrumentation, and hardware infrastructure rather than AI algorithms or quantum systems.
UAlbany symposium focuses on measuring nanoscale chip features

UAlbany’s 2026 symposium spotlights metrology, the precise measurement of incredibly small features on computer chips during fabrication.
Photo: Patrick Dodson · albany.edu October 22-23, the 2026 Albany Nanotechnology Symposium will convene at UAlbany’s ETEC Building, culminating UAlbany’s Research & Economic Development Week with a focus on the critical measurements used in advanced chip…
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