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TeD-Loc advances weakly supervised object localization by distilling semantic knowledge from CLIP text embeddings directly into patch-level representations, effectively addressing the spatial limitations of traditional class activation mapping. By integrating a localization-guided classification module and applying QR-based orthogonalization for similar classes, this method achieves superior accuracy on benchmarks like CUB and histopathology datasets while maintaining efficient inference compared to complex prompt-learning strategies.
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TeD-Loc: Text Distillation for Weakly Supervised Object Localization

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arXiv:2501.12632v3 Announce Type: replace-cross Abstract: Weakly supervised object localization (WSOL) models can predict both the object class and the spatial regions corresponding to the object, without requiring explicit bounding-box annotations. Given their reliance on classification objectives, traditional WSOL methods, like class activation mapping, tend to focus on the most discriminative object regions, often missing the full spatial extent. Although vision-language models like CLIP encode rich semantic priors, their global text and class-token embeddings are not explicitly aligned with local patch embeddings, limiting patch-level localization. Recent methods such as GenPrompt address this limitation, but at the cost of increased complexity, as they rely on conditional denoising and elaborate prompt-learning strategies. In this paper, we propose Text Distillation for Localization (TeD-Loc), which distills knowledge from CLIP text embeddings to patch embeddings through contrastive alignment, thereby enabling patch-level foreground/background localization. A localization-guided classification module is also introduced, which uses localization scores to aggregate foreground patch embeddings for joint classification and localization within a single model. In addition, a QR-based orthogonalization of class text embeddings is applied before distillation to improve discrimination for semantically similar classes. Extensive experiments show that TeD-Loc improves Top-1 Loc by ~5% on CUB and ILSVRC, and PxAP by ~31% on histopathology benchmarks, while achieving more efficient inference than GenPrompt.

Abstract:Weakly supervised object localization (WSOL) models can predict both the object class and the spatial regions corresponding to the object, without requiring explicit bounding-box annotations. Given their reliance on classification objectives, traditional WSOL methods, like class activation mapping, tend to focus on the most discriminative object regions, often missing the full spatial extent. Although vision-language models like CLIP encode rich semantic priors, their global text and class-token embeddings are not explicitly aligned with local patch embeddings, limiting patch-level localization. Recent methods such as GenPrompt address this limitation, but at the cost of increased complexity, as they rely on conditional denoising and elaborate prompt-learning strategies. In this paper, we propose Text Distillation for Localization (TeD-Loc), which distills knowledge from CLIP text embeddings to patch embeddings through contrastive alignment, thereby enabling patch-level foreground/background localization. A localization-guided classification module is also introduced, which uses localization scores to aggregate foreground patch embeddings for joint classification and localization within a single model. In addition, a QR-based orthogonalization of class text embeddings is applied before distillation to improve discrimination for semantically similar classes. Extensive experiments show that TeD-Loc improves Top-1 Loc by ~5% on CUB and ILSVRC, and PxAP by ~31% on histopathology benchmarks, while achieving more efficient inference than GenPrompt.

Computer Vision and Pattern Recognition (cs.CV); Machine Learning (cs.LG)

arXiv:2501.12632 [cs.CV]

(or arXiv:2501.12632v3 [cs.CV] for this version)

https://doi.org/10.48550/arXiv.2501.12632 Focus to learn more arXiv-issued DOI via DataCite

https://doi.org/10.1016/j.patcog.2026.114994 Focus to learn more DOI(s) linking to related resources

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