TASTE: Throughput-Aware Batch Size Tuning for On-Device Edge Learning

arXiv:2609.07444v1 Announce Type: new Abstract: The rise of privacy-preserving artificial intelligence (AI) has shifted the focus of model adaptation and personalization towards on-device learning, where deep learning models are finetuned directly on edge hardware using local user data. However, this shift requires optimization of deep learning training on resource-constrained hardware to maximize throughput while maintaining predictive accuracy. This paper introduces a novel technique for on-device model training that incorporates an efficient Bayesian optimization-based batch size tuning approach to maximize hardware throughput. To evaluate the impact of this hyperparameter on the learning dynamics, we investigated two distinct paradigms: standard supervised learning (SL) and online continual learning (CL). Experimental results across various edge devices demonstrate a throughput ceiling, beyond which increasing the batch size yields no additional throughput gains. The proposed tuning approach identifies the optimal batch size, which, when combined with gradient accumulation and linear learning rate scaling, achieves up to a 2X increase in training throughput on platforms such as Raspberry Pi 4 compared to maximum batch sizes, without compromising model accuracy. Furthermore, in the CL paradigm, we demonstrate that optimal batch sizes maintain the stability-plasticity balance required for incremental learning, effectively mitigating catastrophic forgetting while maximizing computational efficiency on edge-hardware.

Abstract:The rise of privacy-preserving artificial intelligence (AI) has shifted the focus of model adaptation and personalization towards on-device learning, where deep learning models are finetuned directly on edge hardware using local user data. However, this shift requires optimization of deep learning training on resource-constrained hardware to maximize throughput while maintaining predictive accuracy. This paper introduces a novel technique for on-device model training that incorporates an efficient Bayesian optimization-based batch size tuning approach to maximize hardware throughput. To evaluate the impact of this hyperparameter on the learning dynamics, we investigated two distinct paradigms: standard supervised learning (SL) and online continual learning (CL). Experimental results across various edge devices demonstrate a throughput ceiling, beyond which increasing the batch size yields no additional throughput gains. The proposed tuning approach identifies the optimal batch size, which, when combined with gradient accumulation and linear learning rate scaling, achieves up to a 2X increase in training throughput on platforms such as Raspberry Pi 4 compared to maximum batch sizes, without compromising model accuracy. Furthermore, in the CL paradigm, we demonstrate that optimal batch sizes maintain the stability-plasticity balance required for incremental learning, effectively mitigating catastrophic forgetting while maximizing computational efficiency on edge-hardware.

Machine Learning (cs.LG); Artificial Intelligence (cs.AI); Hardware Architecture (cs.AR); Performance (cs.PF)

arXiv:2609.07444 [cs.LG]

(or arXiv:2609.07444v1 [cs.LG] for this version)

https://doi.org/10.48550/arXiv.2609.07444 Focus to learn more arXiv-issued DOI via DataCite (pending registration)

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TASTE: Throughput-Aware Batch Size Tuning for On-Device Edge Learning

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