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This research applies Large Language Models to accelerate analog IC layout refinement by reducing the number of costly post-layout simulations required for parameter tuning. By integrating an act-observe-reflect loop, the proposed framework significantly improves sample efficiency compared to traditional Bayesian Optimization methods while maintaining geometric context awareness. The work demonstrates a practical pathway for leveraging generative AI in specialized hardware design workflows where simulation costs are prohibitive.
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Simulation-Aware In-Context Policy Improvement for LLM-Aided Analog Layout Refinement

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arXiv:2608.13767v1 Announce Type: cross Abstract: Analog IC layout design remains a labor-intensive iterative process dominated by simulation-driven refinement. Although end-to-end layout generators accelerate initial placement and routing, they still require experts to manually tune layout optimization parameters with repeated post-layout simulations for stringent design specifications. While Bayesian Optimization (BO) is widely adopted for parameter tuning in analog IC design, at the layout level it typically requires hundreds to thousands of evaluations, each involving costly parasitic extraction and post-layout simulation, which makes it impractical. Recently, Large Language Models (LLMs) have demonstrated potential in improving the sample efficiency of such simulation-driven tuning. However, their restricted access to geometric layout context and design-specific heuristics limits their ability to manipulate the layout optimization process. In this paper, we propose a simulation-aware LLM multi-agent framework that performs in-context policy improvement (ICPI) by iteratively updating layout optimization parameters exposed by an analog layout generator through an act-observe-reflect loop on compact structured layout representations. Experiments on real-world analog circuits show that, with only tens of post-layout simulations, our approach improves post-layout performance over the generator's built-in heuristics and BO-based tuning method.

Abstract:Analog IC layout design remains a labor-intensive iterative process dominated by simulation-driven refinement. Although end-to-end layout generators accelerate initial placement and routing, they still require experts to manually tune layout optimization parameters with repeated post-layout simulations for stringent design specifications. While Bayesian Optimization (BO) is widely adopted for parameter tuning in analog IC design, at the layout level it typically requires hundreds to thousands of evaluations, each involving costly parasitic extraction and post-layout simulation, which makes it impractical. Recently, Large Language Models (LLMs) have demonstrated potential in improving the sample efficiency of such simulation-driven tuning. However, their restricted access to geometric layout context and design-specific heuristics limits their ability to manipulate the layout optimization process. In this paper, we propose a simulation-aware LLM multi-agent framework that performs in-context policy improvement (ICPI) by iteratively updating layout optimization parameters exposed by an analog layout generator through an act-observe-reflect loop on compact structured layout representations. Experiments on real-world analog circuits show that, with only tens of post-layout simulations, our approach improves post-layout performance over the generator's built-in heuristics and BO-based tuning method.

7 pages, 3 figures. To appear in the Proceedings of the 2026 International Conference on LLM-Aided Design (ICLAD 2026)

Artificial Intelligence (cs.AI); Robotics (cs.RO)

arXiv:2608.13767 [cs.AI]

(or arXiv:2608.13767v1 [cs.AI] for this version)

https://doi.org/10.48550/arXiv.2608.13767 Focus to learn more arXiv-issued DOI via DataCite (pending registration)

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