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This research introduces SBOCF, a scalable Bayesian optimization framework that significantly accelerates parameter estimation in electron microscopy by reducing computational costs without requiring extensive pretraining. By efficiently handling high-dimensional structured outputs from expensive physics-based simulators, the method enables sharper atomic reconstructions for complex materials like SrTiO3.
Scalable Bayesian Optimization of Composite Functions for Image-Based Inverse Problems in Materials Characterization
arXiv:2609.02126v1 Announce Type: new Abstract: Estimating physical parameters from scientific images is a common inverse problem in materials characterization that often relies on expensive physics-based simulations. In electron microscopy, specimen thickness and crystal mistilt are critical parameters that govern how electrons scatter through the sample, and therefore the accuracy of any atomic-scale structure recovered from it. They are commonly inferred by matching experimental position-averaged convergent-beam electron diffraction (PACBED) patterns to simulated ones, but grid searches scale poorly and neural-network methods require extensive pretraining that may not transfer to new conditions. Here, we propose scalable Bayesian optimization of composite functions (SBOCF), a simulation-efficient method that exploits the known composite structure of the image-matching objective and the intermediate information contained in simulated images. By representing PACBED images with patch-level summaries and two correction terms, SBOCF preserves the original pixel-wise objective while reducing the number of modeled outputs from 24,649 to 11. Under a budget of 50 simulator evaluations, SBOCF outperformed standard Bayesian optimization with expected improvement on synthetic SrTiO3 benchmarks with thick and thin specimens, reducing the median final SSE by up to 290x in the thick-sample case. On experimental data, SBOCF produced parameter estimates consistent with previously reported values without task-specific pretraining. For a simulated mistilted specimen, using the SBOCF estimates in a downstream ptychographic reconstruction recovered sharp atoms that were otherwise blurred. These results establish SBOCF as a promising approach for inverse problems involving expensive simulators and high-dimensional structured outputs.
Abstract:Estimating physical parameters from scientific images is a common inverse problem in materials characterization that often relies on expensive physics-based simulations. In electron microscopy, specimen thickness and crystal mistilt are critical parameters that govern how electrons scatter through the sample, and therefore the accuracy of any atomic-scale structure recovered from it. They are commonly inferred by matching experimental position-averaged convergent-beam electron diffraction (PACBED) patterns to simulated ones, but grid searches scale poorly and neural-network methods require extensive pretraining that may not transfer to new conditions. Here, we propose scalable Bayesian optimization of composite functions (SBOCF), a simulation-efficient method that exploits the known composite structure of the image-matching objective and the intermediate information contained in simulated images. By representing PACBED images with patch-level summaries and two correction terms, SBOCF preserves the original pixel-wise objective while reducing the number of modeled outputs from 24,649 to 11. Under a budget of 50 simulator evaluations, SBOCF outperformed standard Bayesian optimization with expected improvement on synthetic SrTiO3 benchmarks with thick and thin specimens, reducing the median final SSE by up to 290x in the thick-sample case. On experimental data, SBOCF produced parameter estimates consistent with previously reported values without task-specific pretraining. For a simulated mistilted specimen, using the SBOCF estimates in a downstream ptychographic reconstruction recovered sharp atoms that were otherwise blurred. These results establish SBOCF as a promising approach for inverse problems involving expensive simulators and high-dimensional structured outputs.
28 pages. Dasol Yoon and Poompol Buathong contributed equally
Machine Learning (cs.LG); Materials Science (cond-mat.mtrl-sci)
arXiv:2609.02126 [cs.LG]
(or arXiv:2609.02126v1 [cs.LG] for this version)
https://doi.org/10.48550/arXiv.2609.02126 Focus to learn more arXiv-issued DOI via DataCite (pending registration)
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