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This study establishes a scaling theory for defect formation during quantum annealing in the random transverse-field Ising model across one, two, and three dimensions. By mapping elementary error events in the excitation energy-control parameter plane, it provides critical insights for designing optimal annealing paths that minimize errors while maintaining computational efficiency. The findings highlight the logarithmic dependence of error density on annealing time, governed by dimension-dependent critical exponents at the infinite-disorder fixed point.
Quantum annealing of the random transverse-field Ising model in one, two, and three dimensions
arXiv:2610.11411v1 Announce Type: cross Abstract: Quantum annealing must be sufficiently slow to prevent defect formation. We study this problem in the random transverse-field Ising model via the adiabatic theorem to obtain the limiting rate at which defect formation can be avoided. Our approach based on the strong-disorder renormalization group (SDRG) technique views the annealing process as a gradual aggregation of strongly coupled clusters, giving access to the elementary events of error formation. We present a scaling theory of the statistics of these events in general dimensions and confront it to an extensive numerical analysis carried out in one, two, and three dimensions by an efficient implementation of the SDRG method. This approach is also validated by exact diagonalization in one dimension by means of the free-fermion technique. Our results consistently show a logarithmically slow decrease of the error density with the annealing time, characterized by the dimension-dependent critical exponents of the corresponding infinite-disorder fixed point of the model. Furthermore, we provide a map of individual events of potential defect formation in the excitation energy - control parameter plane, which may help in the design of optimal annealing paths.
Abstract:Quantum annealing must be sufficiently slow to prevent defect formation. We study this problem in the random transverse-field Ising model via the adiabatic theorem to obtain the limiting rate at which defect formation can be avoided. Our approach based on the strong-disorder renormalization group (SDRG) technique views the annealing process as a gradual aggregation of strongly coupled clusters, giving access to the elementary events of error formation. We present a scaling theory of the statistics of these events in general dimensions and confront it to an extensive numerical analysis carried out in one, two, and three dimensions by an efficient implementation of the SDRG method. This approach is also validated by exact diagonalization in one dimension by means of the free-fermion technique. Our results consistently show a logarithmically slow decrease of the error density with the annealing time, characterized by the dimension-dependent critical exponents of the corresponding infinite-disorder fixed point of the model. Furthermore, we provide a map of individual events of potential defect formation in the excitation energy - control parameter plane, which may help in the design of optimal annealing paths.
Statistical Mechanics (cond-mat.stat-mech); Disordered Systems and Neural Networks (cond-mat.dis-nn); Quantum Physics (quant-ph)
arXiv:2610.11411 [cond-mat.stat-mech]
(or arXiv:2610.11411v1 [cond-mat.stat-mech] for this version)
https://doi.org/10.48550/arXiv.2610.11411 Focus to learn more arXiv-issued DOI via DataCite (pending registration)
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