ORNL’s SimuScan cuts data labeling time for atomic force microscopes

Oak Ridge National Laboratory researchers have developed SimuScan, an artificial intelligence framework that guides atomic force microscopes toward the most informative areas of a sample for closer study. Although atomic force microscopy reveals structures as small as molecules, operating the instrument traditionally requires expert judgment regarding scan location and settings; SimuScan aims to reduce this burden and enable faster, more consistent research. “Operating an atomic force microscope is a bit like piloting a modern jet,” said Liam Collins, an ORNL senior R&D scientist at the Center for Nanophase Materials Sciences (CNMS).…