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This research advances quantum sensing by developing methods to directly determine the distance and orientation of nitrogen vacancy centers in diamond without relying on external calibration fields. By eliminating these free fitting parameters, the study significantly improves the accuracy of nanoscale magnetic field imaging for materials characterization. The work represents a key methodological step toward practical applications of solid-state qubits as high-precision magnetometers.
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Methods for traceable scanning magnetometry using single nitrogen vacancy centers in diamond: determining orientation, distance and localization

arXiv2 min de cititArticolul și perspectiva sunt în engleză.

arXiv:2608.04632v1 Announce Type: cross Abstract: Individual, scannable nitrogen vacancy (NV) centers in single crystal diamond nanostructures enable nanoscale, quantitative imaging of magnetic stray fields. Nevertheless, important parameters like distance between the NV center and the sample and the orientation of the NV high symmetry axis are often not known precisely and enter data evaluation as free fitting parameters. We here use scanning NV imaging on micro-patterned, perpendicularly magnetized stripes and discs. From these measurements, we directly infer NV - sample distance d_NV and the NV's azimuthal orientation without the need for an external vector magnet control. We determine d_NV = 31.5 nm, while we infer the azimuthal orientation with a precision of 3{\deg}. We additionally employ commercially available silicon needles to image the apex topography of our diamond nanostructures to detect surface contamination. Simultaneously, monitoring NV fluorescence as a function of the needle's position allows us to estimate the lateral placement of the NV inside the diamond nanostructure.

Abstract:Individual, scannable nitrogen vacancy (NV) centers in single crystal diamond nanostructures enable nanoscale, quantitative imaging of magnetic stray fields. Nevertheless, important parameters like distance between the NV center and the sample and the orientation of the NV high symmetry axis are often not known precisely and enter data evaluation as free fitting parameters. We here use scanning NV imaging on micro-patterned, perpendicularly magnetized stripes and discs. From these measurements, we directly infer NV - sample distance d_NV and the NV's azimuthal orientation without the need for an external vector magnet control. We determine d_NV = 31.5 nm, while we infer the azimuthal orientation with a precision of 3°. We additionally employ commercially available silicon needles to image the apex topography of our diamond nanostructures to detect surface contamination. Simultaneously, monitoring NV fluorescence as a function of the needle's position allows us to estimate the lateral placement of the NV inside the diamond nanostructure.

Mesoscale and Nanoscale Physics (cond-mat.mes-hall); Applied Physics (physics.app-ph); Quantum Physics (quant-ph)

arXiv:2608.04632 [cond-mat.mes-hall]

(or arXiv:2608.04632v1 [cond-mat.mes-hall] for this version)

https://doi.org/10.48550/arXiv.2608.04632 Focus to learn more arXiv-issued DOI via DataCite (pending registration)

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