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This study addresses a critical measurement error in assessing the mechanical properties of perovskite nanoparticles by replacing sharp atomic force microscope probes with blunt ones to prevent sample destruction. By integrating 3D modeling that accounts for particle irregularities and probe geometry, researchers now obtain accurate data on durability essential for developing flexible electronics like folding screens and solar cells. The findings provide a more reliable framework for characterizing these fragile semiconductor compounds before they are deployed in commercial devices.