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This research introduces a zero-setup AI framework that enables immediate, interpretable segmentation of synchrotron X-ray tomography data without manual retraining or user input. By leveraging pretrained semantic networks with material-agnostic strategies, the system accelerates scientific imaging workflows and provides rapid feedback for beamline experiments. The approach significantly outperforms traditional thresholding methods while remaining adaptable for future fine-tuning on specific materials.
From Reconstruction to Interpretation: Zero-Setup Multi-Phase Segmentation of X-ray Tomography Data
arXiv:2607.12175v3 Announce Type: replace-cross Abstract: X-ray tomography enables nondestructive characterization of material microstructures, while advances in micro-CT imaging have accelerated volumetric data acquisition and reconstruction. However, rapid interpretation remains limited by image segmentation, which often requires manual thresholding, user prompting, or material-specific model training. We present a zero-setup framework for multi-phase segmentation of synchrotron X-ray tomography data that generates interpretable masks for previously unseen datasets without user input or retraining during deployment. The framework combines a material-agnostic mask preparation strategy with a pretrained semantic segmentation network. It represents commonly occurring structural regions as background, sample, bright, dark-gray, light-gray, and porosity masks. Unlike conventional deep learning pipelines that require dataset-specific annotations and retraining, the proposed framework can be applied directly to new scans and produce diagnostic-level segmentations within minutes of reconstruction. This enables rapid assessment of scan quality, sample morphology, porosity, and attenuation variations during ongoing beamline experiments. The generated masks can later be manually refined or used to fine-tune application-specific models when greater accuracy or material-specific labeling is required. Evaluation on held-out synchrotron micro-CT images and qualitative testing on additional datasets demonstrate consistent and physically meaningful segmentations across varying samples and imaging conditions. The framework also substantially outperforms conventional intensity-based thresholding. By connecting high-speed reconstruction with immediate interpretation, the approach supports near-real-time beamline feedback and scalable AI-assisted scientific imaging workflows.
Abstract:X-ray tomography enables nondestructive characterization of material microstructures, while advances in micro-CT imaging have accelerated volumetric data acquisition and reconstruction. However, rapid interpretation remains limited by image segmentation, which often requires manual thresholding, user prompting, or material-specific model training. We present a zero-setup framework for multi-phase segmentation of synchrotron X-ray tomography data that generates interpretable masks for previously unseen datasets without user input or retraining during deployment. The framework combines a material-agnostic mask preparation strategy with a pretrained semantic segmentation network. It represents commonly occurring structural regions as background, sample, bright, dark-gray, light-gray, and porosity masks. Unlike conventional deep learning pipelines that require dataset-specific annotations and retraining, the proposed framework can be applied directly to new scans and produce diagnostic-level segmentations within minutes of reconstruction. This enables rapid assessment of scan quality, sample morphology, porosity, and attenuation variations during ongoing beamline experiments. The generated masks can later be manually refined or used to fine-tune application-specific models when greater accuracy or material-specific labeling is required. Evaluation on held-out synchrotron micro-CT images and qualitative testing on additional datasets demonstrate consistent and physically meaningful segmentations across varying samples and imaging conditions. The framework also substantially outperforms conventional intensity-based thresholding. By connecting high-speed reconstruction with immediate interpretation, the approach supports near-real-time beamline feedback and scalable AI-assisted scientific imaging workflows.
Computer Vision and Pattern Recognition (cs.CV); Artificial Intelligence (cs.AI)
arXiv:2607.12175 [cs.CV]
(or arXiv:2607.12175v3 [cs.CV] for this version)
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