Fault tolerance estimation in digital circuits with visualised generative networks

Abstract:We propose a new numerical method to estimate the fault tolerance of failure modes in digital circuit structures with a generative network sampling technique. From a random input of generated bitwise configurations of ideally digitalised analog currents in the digital circuit design with classical logical gates, expected output currents are compared to the realistic signals of a numerical experiment at the discriminator part of the Generative Adversarial Network (GAN) to calculate the deviation from ideal digital electronic signals, including various error modes, such as missing or interchanged logical devices. From the present analysis of a representation of the GAN in terms of complex variables, it is possible to evaluate the robustness in electronic designs by differentiating the impact of failure modes associated with different classical logical elements in the circuit.

Hardware Architecture (cs.AR); Artificial Intelligence (cs.AI); Computational Engineering, Finance, and Science (cs.CE)

arXiv:2605.15212 [cs.AR]

(or arXiv:2605.15212v2 [cs.AR] for this version)

https://doi.org/10.48550/arXiv.2605.15212 Focus to learn more arXiv-issued DOI via DataCite

arXivLabs is a framework that allows collaborators to develop and share new arXiv features directly on our website.

Both individuals and organizations that work with arXivLabs have embraced and accepted our values of openness, community, excellence, and user data privacy. arXiv is committed to these values and only works with partners that adhere to them.

Have an idea for a project that will add value for arXiv's community? Learn more about arXivLabs.