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This paper provides exact analytical calculations of logical error rates and acceptance probabilities for magic state distillation circuits, offering a rigorous validation of previous numerical simulations using actual $T$ gates rather than proxies. By deriving series expansions up to high-order noise terms, the study clarifies the effective fault distances of these protocols and explains observed distance degradation effects in companion codes. These precise benchmarks are essential for assessing the viability of magic state distillation as a core component of fault-tolerant quantum computing architectures.
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Exact logical error rates for magic state cultivation

arXiv2 min de cititArticolul și perspectiva sunt în engleză.

arXiv:2609.18922v1 Announce Type: new Abstract: We compute exactly the acceptance and logical error rates for the distance $d=3$ and $d=5$ magic state cultivation circuits from Clifft [arXiv:2604.27058] and SOFT [arXiv:2512.23037] using Pauli propagation and binary tensor contraction. Actual $T$ gates are studied, not the $S$-gate proxy used for sampling. The calculation includes every fault order at several circuit-level noise strengths ($p$). We provide a series expansion form to the logical error rates, through order $(p/(1-p))^{10}$. The analytical results recover the numerical values from Clifft and SOFT at both $d=3$ and $d=5$ to within their sampling uncertainty. Then, we show that the $d=3$ and $d=5$ circuits actually have fault distances of $d_{\text{fault}}=2$ and $d_{\text{fault}}=3$ respectively, explaining the similar distance degrading effects from the companion code of [Quantum 10, 2134 (2026)].

Abstract:We compute exactly the acceptance and logical error rates for the distance $d=3$ and $d=5$ magic state cultivation circuits from Clifft [arXiv:2604.27058] and SOFT [arXiv:2512.23037] using Pauli propagation and binary tensor contraction. Actual $T$ gates are studied, not the $S$-gate proxy used for sampling. The calculation includes every fault order at several circuit-level noise strengths ($p$). We provide a series expansion form to the logical error rates, through order $(p/(1-p))^{10}$. The analytical results recover the numerical values from Clifft and SOFT at both $d=3$ and $d=5$ to within their sampling uncertainty. Then, we show that the $d=3$ and $d=5$ circuits actually have fault distances of $d_{\text{fault}}=2$ and $d_{\text{fault}}=3$ respectively, explaining the similar distance degrading effects from the companion code of [Quantum 10, 2134 (2026)].

arXiv:2609.18922 [quant-ph]

(or arXiv:2609.18922v1 [quant-ph] for this version)

https://doi.org/10.48550/arXiv.2609.18922 Focus to learn more arXiv-issued DOI via DataCite (pending registration)

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