Sari la conținut

Română · beta. Traducerea a fost făcută automat și este încă în curs de revizuire. Citește pagina în engleză

perspectiva aiqbenchCercetare AI

analiza aiqbench

This research demonstrates how integrating epistemic uncertainty into machine learning frameworks can significantly enhance safety-critical defect detection in medical device manufacturing. By employing a principled rejection strategy, the model reduces classification errors by up to 48% on real-world FDA data while explicitly controlling prediction coverage. The findings validate that abstaining from high-uncertainty predictions is a practical method for ensuring reliability in automated quality assurance systems.
Sursă care acoperăarXiv
Ce este aceastaLectura unui model asupra articolului și a acoperirii conexe, scrisă pentru aiqbench. Nu sunt cuvintele publicației.

Epistemic Uncertainty-Aware Defect Detection for Quality Control in Medical Device Manufacturing

arXiv3 min de cititArticolul și perspectiva sunt în engleză.

arXiv:2610.09057v1 Announce Type: new Abstract: Objective: We investigate whether accounting for epistemic uncertainty can improve the reliability of automated defect detection in medical device manufacturing. Methods: We consider a machine learning framework that operates on heterogeneous manufacturing and device-report data represented with Knowledge Graphs. To mitigate errors arising from uncertainty in the decision model, we analyze a principled rejection strategy to abstain from predictions whose estimated epistemic uncertainty exceeds a specified threshold. We evaluate the approach using standard synthetic benchmarks and real-world medical device report data. Results: The theoretical results establish the validity of the method characterizing the regimes under which it is expected to be effective. Empirically, the rejection strategy enables explicit control of coverage, that is, the proportion of samples for which the model issues predictions, while improving performance on the retained samples. On 266,170 real-world FDA MAUDE device reports, a 10% abstention rate reduces classification error by 48%, and more aggressive rejection (approximately 70% coverage) yields near-perfect accuracy on the retained samples. On standard synthetic manufacturing benchmarks, abstaining on 9% of the decisions, our approach reduces the risk up to 63% compared with the standard no-abstention approach. Conclusions: Abstaining from predictions with high epistemic uncertainty can provide a practical tool for controlling the reliability of machine learning-based defect detection, especially in high-stakes medical device manufacturing applications. Significance: Uncertainty-aware defect detection may support safer and more reliable quality assurance in medical device manufacturing by identifying cases that require additional inspection rather than issuing potentially harmful predictions.

Abstract:Objective: We investigate whether accounting for epistemic uncertainty can improve the reliability of automated defect detection in medical device manufacturing. Methods: We consider a machine learning framework that operates on heterogeneous manufacturing and device-report data represented with Knowledge Graphs. To mitigate errors arising from uncertainty in the decision model, we analyze a principled rejection strategy to abstain from predictions whose estimated epistemic uncertainty exceeds a specified threshold. We evaluate the approach using standard synthetic benchmarks and real-world medical device report data. Results: The theoretical results establish the validity of the method characterizing the regimes under which it is expected to be effective. Empirically, the rejection strategy enables explicit control of coverage, that is, the proportion of samples for which the model issues predictions, while improving performance on the retained samples. On 266,170 real-world FDA MAUDE device reports, a 10% abstention rate reduces classification error by 48%, and more aggressive rejection (approximately 70% coverage) yields near-perfect accuracy on the retained samples. On standard synthetic manufacturing benchmarks, abstaining on 9% of the decisions, our approach reduces the risk up to 63% compared with the standard no-abstention approach. Conclusions: Abstaining from predictions with high epistemic uncertainty can provide a practical tool for controlling the reliability of machine learning-based defect detection, especially in high-stakes medical device manufacturing applications. Significance: Uncertainty-aware defect detection may support safer and more reliable quality assurance in medical device manufacturing by identifying cases that require additional inspection rather than issuing potentially harmful predictions.

Artificial Intelligence (cs.AI)

arXiv:2610.09057 [cs.AI]

(or arXiv:2610.09057v1 [cs.AI] for this version)

https://doi.org/10.48550/arXiv.2610.09057 Focus to learn more arXiv-issued DOI via DataCite (pending registration)

arXivLabs is a framework that allows collaborators to develop and share new arXiv features directly on our website.

Both individuals and organizations that work with arXivLabs have embraced and accepted our values of openness, community, excellence, and user data privacy. arXiv is committed to these values and only works with partners that adhere to them.

Have an idea for a project that will add value for arXiv's community? Learn more about arXivLabs.

Text integral sub licența deschisă a publicației · 337 cuvinte

Subiecte conexe